MicroTestSystem, Inc.

RS-1000 DDR-II 667 MHz Memory Tester

(download brochure)

Features:

• Test both registered and unbuffered 240-pin DIMM modules
• 5-option buttons with functions indicated on display
• 1 heavy duty test start button
• LED indicating testing status
• USB-port interface with PC for configuration test options
• Handler interface port
• Yamaichi Burn-In socket with socket saver
• Backlit LCD display
• Auto Identifying Device under test
• Configurable test devices
• True Clock and Bus Speed testing

Upgradeable Options:

• Online software and firmware downloads
• SODIMM adaptor
• DDRI Adaptor (available post release)
• IC Chip Testing Adaptor (available post release)
  

Adaptor Options:

• 200-pin DDR-II SODIMM adaptor
• 184-pin DDR-I DIMM adaptor
• 200-pin DDR-I SODIMM adaptor
  

Specifications:

• Clock Speed: 200, 266, 333, 350 MHz
• Data Speed: 400, 533, 667, and 700 MHz
• Address Size: 4 Giga (16 rows, 16 columns)
• Data Width: 72 Bits
• DC Parameters:
  • VCC Voltage range 1.5 – 2.8 volts
  • VTT tracks VCC by ½ SSTL 18 and SSTL 2 compliant Programmable VSP
• CAS Latency: 3 / 4 / 5 Clocks
• Trd & Trp: 3 / 4 / 5 Clocks
• Write Latency: 2 / 3 Clocks
• Internal Bank: 4 / 8 Banks
• Burst Length: 4 / 8
• ODT Selection: 75 Ohms / 150 Ohms
• OCD Adjustment: Auto Calibration
• Posted CAS (AL): 0 / 1 / 2 / 3 / 4 Clocks
• Refresh Cycle: Auto and Self Refresh
• AC Pattern:

Open / Short Test (OST)
General Function Check (GFC)
Aggressive Scan Test (AST)
Refresh Test (RT)

• SPD Option: Program / Read / Verify 0 – 255 Bytes
• Power Input: 110Vac / 240Vac switchable 50 Hz / 60 Hz
• Operating Temp: 25 – 115 Degrees F
• Dimensions: 16” x 11” x 4”
• Weight: ~6 pounds